Four Dimensions' Mercury Probe Selection Guide

 

Type Dot area Application    
Large area > thick oxides
failure analysis tbd		    
Standard ~ 0.015 cm2 low k materials, thin oxide    
Small < 5E-4 cm2 leaky materials
intrinsic oxide properties
ultra thin oxide		    
         
High Voltage variable
usually small		 for breakdown measurements of thick oxides    
High frequency variable for C-V measurements up to 10 MHz    
         
Ring / dot variable insulating substrates
compound semiconductors
high resistivity materials		    
         
ULTEM   small edge exclusion    
Polycarbonate   standard with integrated light source    
         
Four Point Probe   sheet resistance measuremets with Models
CVRmap 3093A/B and M4PP3093		    
Custom   Customized probe geometries    

We are happy to help you with the probe selection for your material's and measurement needs. Please contact us at info@4dimensions.com for assistance.

All rights reserved Four Dimensions, Inc., Specifications subject to change without notice.