We are happy to help you with the probe head selection for your material's needs. Please contact us at info@4dimensions.com for assistance.
Mercury Probe Selection Guide
| Type | Dot area | Application |
|---|---|---|
| Large area | > | thick oxides failure analysis tbd |
| Standard | ~ 0.015 cm2 | low k materials, thin oxide |
| Small | < 5E-4 cm2 | leaky materials intrinsic oxide properties ultra thin oxide |
| High Voltage | variable usually small |
for breakdown measurements of thick oxides |
| High frequency | variable | for C-V measurements up to 10 MHz |
| Ring / dot | variable | insulating substrates compound semiconductors high resistivity materials |
| ULTEM | small edge exclusion | |
| Polycarbonate | standard with integrated light source | |
| Four Point Probe | sheet resistance measuremets with Models CVRmap 3093A/B and M4PP3093 |
|
| Custom | Customized probe geometries |